Identifying charge states of molecules with spin-flip spectroscopy

Physical Review Letters 103, 257202 (2009)

 

The charge states of single molecular magnetic chains were manipulated with a scanning tunneling microscope and identified by spin-flip inelastic tunneling spectroscopy. We show that the charged and neutral states have different spin structures and therefore exhibit different features associated with the spin-flip processes in tunneling spectra. The experiment demonstrates a general approach for detecting the charge states at the nanometer scale in a more straightforward manner than using indirect information.

 


 

Probing super-exchange interaction in molecular magnets by spin-flip spectroscopy and microscopy

Physical Review Letters 101, 197208 (2008)

 

The super-exchange mechanism in cobalt phthalocyanine (CoPc) thin films was studied by a low temperature scanning tunneling microscope. The CoPc molecules were found to form one-dimensional antiferromagnetic chains in the film. Collective spin excitations in individual molecular chains were measured with spin-flip associated inelastic electron tunneling spectroscopy. By spatially mapping the spin-flipping channels with sub-molecular precision, we are able to explicitly identify the specific molecular orbitals that mediate the super-exchange interaction between molecules.

 


 

Manipulating the Kondo resonance through quantum size effects

Physical Review Letters 99, 256601 (2007)

 

Manipulating the Kondo effect by quantum confinement has been achieved by placing magnetic molecules on silicon-supported nanostructures. The Kondo resonance of individual manganese phthalocyanine (MnPc) molecules adsorbed on the top of Pb islands was studied by scanning tunneling spectroscopy. Oscillating Kondo temperatures as a function of film thickness were observed and attributed to the formation of the thickness-dependent quantum-well states in the host Pb islands. The present approach provides a technologically feasible way for single spin manipulation by precise thickness control of thin films.